seminario

Metrology for Industry 4.0 & IoT - Giornata 2

The Fourth Industrial Revolution represents a fundamental change in the way we live, work,
and relate to one another It is a new chapter in human development, enabled by technology
advances that are commensurate with those of the first, second, and third industrial
revolutions The speed, breadth, and depth of this revolution are forcing us to rethink how
countries should develop and how organizations create value
The 6 th edition of IEEE MetroInd 4 0 &IoT aims to discuss the contributions both of the
metrology for the development of Industry 4 0 and IoT and the new opportunities offered by
Industry 4 0 and IoT for the development of new measurement methods and instruments
IEEE
MetroInd 4 0 &IoT wants to federate stakeholders active in developing instrumentation
and measurement methods for Industry 4 0 and IoT with new technologies for metrology
assisted production, component measurement, sensors and associated signal conditioning,
and calibration methods for electronic test

WEDNESDAY, JUNE 7 2023
09:00 - 09:50
Keynote Speaker - Pedro Marti ns,
University of Minho, Portugal
Printi ng and Electronics: Friends with benefi ts
Aula Consiliare
Hall N3
10:00 - 11:00
Session 5.1 - Positi oning, tracking and navigati onin the Industry 4.0 era - Part I
Session 5.2 - Wearable Sensors for UnobtrusiveMonitoring of Physiological Parameters andHuman Acti viti es - Part III
11:00 - 11:30
COFFEE BREAK
11:30 - 12:30
Session 6.1 - Printed Sensors for Industrial andMedical IoT: Innovati on and Challenges - Part I
Session 6.2 - Augmented products for safety andsports - Part I
12:30 - 14:20
LUNCH
Aula Consiliare
Hall N3
14:20 - 15:40
Session 7.1 - Printed Sensors for Industrial andMedical IoT: Innovati on and Challenges - Part II
Session 7.2 - Smart sensors for measurements inbiomedical and biotechnological applicati ons -Part I
15:40 - 16:10
COFFEE BREAK
16:10 - 17:50
Session 8.1 - Positi oning, tracking and navigati onin the Industry 4.0 era - Part II
Session 8.2 - Smart sensors for measurements inbiomedical and biotechnological applicati ons -Part II

COSTO:

Gratuito

L'evento è composto dai seguenti appuntamenti:

APERTURA ISCRIZIONI: